Year-end Sale % OFF 
Abstract
An algorithm is presented that allows for noniterative extraction of the parameters of the Pucel and Pospieszalski FET noise models directly from noise-figure measurements. Since the goal is to minimize the number of source-pull measurements, the number of different source admittances required as a minimum to determine the model parameters reliably is investigated. It turns out that, in the case of the Pospieszalski model, 50-/spl Omega/ measurements are sufficient, while in case of the Pucel model, three additional source impedances have to be taken into account. The results are verified by investigating MESFET and pseudomorphic high electron-mobility transistor devices.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Microwave Theory and Techniques
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
