Abstract
Diffusion of platinum in zinc selenide has been studied by the use of the He4 and C12 ion backscattering techniques. The samples were thin films grown by molecular beam epitaxy on GaAs (100) epitaxial layers followed by evaporation of platinum and annealing in the temperature range 500–800 °C. The diffusion coefficients were determined by the fitting of a concentration independent solution of the diffusion equation to the experimental depth profiles. The activation energy and the pre-exponential factor of the diffusion process were found to be 1.7 eV and 6.4×10−6 cm2/s, respectively.
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