Diffraction of X rays at a Bragg angle of π/2 (Back reflection) with consideration of multiwave effects

Abstract

The energy dependence of the back reflectivity in the dynamical diffraction of x rays at a Bragg angle of π/2 (back diffraction) in perfect crystals of cubic symmetry (silicon) is investigated theoretically. In this case strict backscattering is realized only under the conditions of multiple diffraction. The features of the influence of multiple diffraction on back reflection in the energy range near the nuclear resonance radiation energy of 14.41 keV for 57Fe nuclei, specifically in the six-wave case, including the silicon (1,9,9) reflection (with an energy of 14.57 keV), which can be investigated experimentally with high energy resolution (1 meV) using synchrotron radiation and a monochromator developed for nuclear resonant absorption, are thoroughly studied. It is shown that the back reflectivity observed under the conditions of multiple diffraction has several maxima on the plot of its energy dependence with a value at each maximum smaller than half, in contrast to two-wave diffraction, where there is one maximum with a value close to unity.