Abstract
Ceramic samples of the ternary 0.5Y0.1Zr0.9O2 − 0.5(0.6SrTiO3 − 0.4BiScO3) system consisting of the individual Y0.1Zr0.9O2 and 0.6SrTiO3 − 0.4BiScO3 subsystems were synthesized using solid-state processing techniques. Coexistence of the tetragonal P42/nmc phase characteristic of the 5Y0.1Zr0.9O2 subsystem and the cubic and tetragonal P4mm phases characteristic of the 0.6SrTiO3 − 0.4BiScO3 subsystem was found at room temperature via the XRD analysis. An examination of the dielectric properties showed anomalous changes within three temperature fields. The dielectric anomalies corresponding to the lowest temperature field (below room temperature) are associated with a diffuse ferroelectric phase transition. Mean temperature dielectric anomalies are corresponding to a dielectric relaxation process. The temperature position of these anomalies strongly depends on a measuring frequency and falls in the temperature 600 ÷ 900 K range. High temperature dielectric anomalies induced an ionic conductivity are observed above ∼900 K.
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