Abstract

Currently, the solutions for interconnecting electronic components with their active face facing on substrates are based on metallic soldering. The mechanical contacts are therefore rigid. In order to enhance the reliability of the bonding, underfill is usually used to redistribute the thermo-mechanical stress created by the Coefficient of Thermal Expansion (CTE) mismatch between the silicon chip and substrate. Underfill is done with epoxy resins containing silica fillers (SiO2). As a result, the removal of components is no longer possible. Moreover, this solution is not suitable for devices integrating ultra-thin silicon components (<100 μm) hybridized on flexible substrates that may be subject to deformation. This is the case, for example, of medical “patches” worn on the person and continuously solicited. Indeed, the rigid contact points are likely to break. To address this issue, we are developing a thin anisotropic conductive and stretchable adhesive film inspired by the adhesion of the gecko. Thanks to the microstructuration of its toes involving about 1 million setae, the gecko can develop a large contact surface and thus a large force of attraction by the multiplication of van der Waals interactions. In this work, this “dry adhesion” based on the principle of “contact splitting”, was implemented in order to improve the adhesion of a flexible interconnection. For this purpose, the surface of a polydimethylsiloxane (PDMS) film was structured with micrometric mushroom-shaped patterns known to be the most efficient form of contact. To this end, silicon molds with varying mushroom geometries were used to shape the PDMS (with different cap and pillar diameters) and the adhesion force microstructured films were assessed (shear and pull-off experiments). To make these films locally conductive through the thickness, a conductive composite was prepared and locally deposited in the mold. One approach we investigated, was using a screen-printing mask. This approach has been implemented and characterized using electrical tests (I-V measurements) in order to select the most suitable films to make a flexible interconnection.

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