DETERMINATION OF THE OPTICAL CONSTANTS OF InxSey THIN FILMS DEPOSITED BY EVAPORATION AND COEVAPORATION

Abstract

In x Se y thin films, grown on soda lime glass substrates in the In 6 Se 7 phase by evaporation of the In 2 Se 3 compound and in the In 2 Se 3 phase by coevaporation of In and Se, were optically characterized through spectral transmittance measurements. A special procedure was developed to determine the thickness d and the optical constants (refractive index n, absorption coefficient α, and optical gap Eg). This includes experimental measurements of the spectral transmittance and the use of a model taking into account interference effects induced by internal reflections presented in the interfaces substrate/film and film/air and the fitting of the n vs. λ curve to the Cauchy equation (n = A + B/λ2). The optical constants of the In x Se y thin films were corrected comparing the experimental transmittance spectrum with the theoretical one. The results revealed that the optical constants of the In x Se y films were significantly affected by the deposition method.