Abstract
We describe a magnetic field scanning instrument designed to extend the spatial resolution of scanning superconducting quantum interference device microscopy into the submicron regime. This instrument, the scanning Josephson junction microscope, scans a single Josephson junction across the surface of a sample, detecting the local magnetic field by the modulation of the junction critical current. By using a submicron junction and a scanning tunneling microscope feedback system to maintain close proximity to the surface, magnetic field sensitivity of 10 μG with a spatial resolution of 0.3 μm should be attainable, opening up new opportunities for imaging vortex configurations and core structure in superconductors and magnetic domains in magnetic materials.
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