Abstract

This paper examines about the power decrease system in a memory cell. It affords a low power high stability 8T Static Random Access Memory (SRAM) cell. Two typically used SRAM cells are analyzed in phrases of their stability and power. It presents improved performance as analyzed with traditional 6T SRAM cell in iterms iof leakage power and static noise margin. The scheme of low power 8T SRAM is executed along enforcing power gating approach. Power gating is executed with the aid of putting a transistor in between the 8T SRAM cell and VDD or ground. However, this avoids the direct VDD and ground path and forming an indirect VDD and indirect ground path. The static noise margin of 8T SRAM is computed to decide higher stability whilst compared with 6T SRAM. It is inferred that the power of the newly programmed 8T SRAM cell is diminished close to 1.5% as contrasted with that of the traditional 8T SRAM cell and the stability is improved close to 8.19%.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call