Abstract
Dependence of the Spill Back Effect on the Energy Level Distribution of Interface States Under the Transfer Gate in CMOS Image Sensor
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https://doi.org/10.1109/jsen.2024.3382088
Copy DOIJournal: IEEE Sensors Journal | Publication Date: May 15, 2024 |
Dependence of the Spill Back Effect on the Energy Level Distribution of Interface States Under the Transfer Gate in CMOS Image Sensor
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