Abstract
We investigated the dependence of Arsenic antisite defect concentration and that of epitaxial thickness (tepi), above which a transition to three dimensional growth appears, on the growth conditions of LTGaAs layers grown by MBE. The antisite defect concentration and the lattice expansion of LT layers grown at 180°C–250°C initially increases with increasing pressure ratio PAs4/PGa and then saturates. On the other hand, tepi decreases with increasing PAs4/PGa and depends strongly on the presence of roughness on the substrate surface. Our results indicates that the transition to 3D growth in LT layers is caused by the reduced surface mobility of the atoms impinging on the growth front during the epitaxy. We also determined the optimum LT growth conditions in order to achieve both maximum AsGa concentration (∼1.4×1020 cm−3) and a smooth surface without a transition to 3D growth.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.