Degradation processes in tungsten filaments at high temperatures

Abstract

Degradation processes in tungsten filaments of lighting lamps under normal operating conditions are experimentally studied. The duration of each measurement in continuous mode is about 18 hours. To increase the measurement accuracy, subtraction (compensation) of the constant component of the voltage is used. To compensate for the constant component of the voltage, a low noise reference DC voltage source is used. Using this scheme allowed decreasing the influence of the inherent noise of power supplies without suppressing degradation processes. It is shown that the relative change in resistance during the measurement does not exceed 2.8·10−3. It is also shown that the joint influence of voltage fluctuations of power supplies and low noise reference voltage source on the measurement results corresponds to a relative change in a resistance equal to 2.8·10−4. The study of degradation processes can be used to assess the reliability (and durability) of products in electrical engineering and radio electronics.