Abstract
In built-in self-test for logic circuits, test data reduction can be achieved using a linear feedback shift register. The probability that this data reduction will allow a faulty circuit to be declared good is the probability of aliasing. Based on the independent bit-error model, we show that the code spectra for the cyclic code generated by the feedback polynomial can be used to obtain an exact expression for the aliasing probability of a multiple input signature register when the test length is a multiple of the cycle length. Several cases are examined and, as expected, primitive feedback polynomials provide the best performance. Some suggestions to avoid peaks in the aliasing probability are given.
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