Aliasing Probability in Multiple Input Signature Registers under Q-ary Symmetric Errors Model

Abstract

The aliasing probability in single and multiple input Linear Automata Signature Registers has been widely studied under the independent bit error model. This paper examines aliasing in a class of Multiple-input Signature Registers (MISR), under the q-ary symmetric error model. By modeling the signature analyzer as two-state Markov process and four-state Markov process, we derived the close aliasing probability form expression of MISR for arbitrary test lengths. These results are used to compute the aliasing probability for the MISR compression technique for arbitrary test lengths.