Abstract
Capacitance–voltage and deep level transient spectroscopy were used to study the capture characteristics of self-assembled InAs/InAlAs quantum dots grown on the InP substrate. It is found that the number of electrons captured by quantum dots can be controlled by varying the width of applied pulse voltage in the DLTS measurements. The Coulomb charging energy and the time of capture can be deduced from the filling time dependent deep level transient spectra.
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