Convergence analysis in near-field imaging

Abstract

This paper is devoted to the mathematical analysis of the direct and inverse modeling of the diffraction by a perfectly conducting grating surface in the near-field regime. It is motivated by our effort to analyze recent significant numerical results, in order to solve a class of inverse rough surface scattering problems in near-field imaging. In a model problem, the diffractive grating surface is assumed to be a small and smooth deformation of a plane surface. On the basis of the variational method, the direct problem is shown to have a unique weak solution. An analytical solution is introduced as a convergent power series in the deformation parameter by using the transformed field and Fourier series expansions. A local uniqueness result is proved for the inverse problem where only a single incident field is needed. On the basis of the analytic solution of the direct problem, an explicit reconstruction formula is presented for recovering the grating surface function with resolution beyond the Rayleigh criterion. Error estimates for the reconstructed grating surface are established with fully revealed dependence on such quantities as the surface deformation parameter, measurement distance, noise level of the scattering data, and regularity of the exact grating surface function.