Abstract
The kinetics and mechanism of light-mediated formic acid (HCOO−) degradation in the presence of semiconducting silver chloride particles are investigated in this study. Our experimental results show that visible-light irradiation of AgCl(s) results in generation of holes and electrons with the photo-generated holes and its initial oxidation product carbonate radical, oxidizing HCOO− to form CO2. The HCOO− degradation rate increases with increase in silver concentration due to increase in rate of photo-generation of holes while the increase in chloride concentration decreases the degradation rate of HCOO− as a result of the scavenging of holes by Cl−, thereby resulting in decreased holes and carbonate radical concentration. The results obtained indicate that a variety of other solution conditions including dioxygen concentration, bicarbonate concentration and pH influence the availability of holes and hence the HCOO− degradation rate in a manner consistent with our understanding of key processes. Based on our experimental results, we have developed a kinetic model capable of predicting AgCl(s)-mediated HCOO− photo-degradation over a wide range of conditions.
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