Abstract
A variety of material measurement systems based on transmission/reflection line method are available to characterize the dielectric properties of materials by extracting the S-parameters using a Vector Network Analyzer (VNA). A waveguide material measurement facility based on transmission/reflection line method has been developed in-house in order to accurately deduct relative dielectric permittivity and tangent loss values of dielectric materials used for manufacturing antenna radome and substrate. In this paper, the experimental measurements of VESPEL, PTFE (Teflon), and RO5880 have been realized in X-band (8–12 GHz) with a very low standard deviation.
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