Abstract
This study investigates the compatibility of material processing and fabrication of micro devices based on sol-gel derived lead zirconate titanate (PZT) thin films. High temperature annealing of sol-gel derived PZT may cause cracking and diffusion of structure layers. The introduction of a buffer layer, (LaxSr 1 − x )MnO 3 , between PZT thin film and metal electrodes improves PZT crystallization and ferroelectricity. Annealing temperature of PZT/LSMO structure using furnace heating is investigated and compared with CO 2 laser annealing. A parameter study of PZT poling shows the improvement of film properties. The fabrication procedures of two exemplar devices, a micro accelerometer and a FPW acoustic sensor illustrate the interaction issues among material structures and processes.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
