Abstract
Abstract The presented work is focused on simulation of piezoelectric effect in thin ceramic layers using finite element method. The layers are the primary components of piezoelectric patches – flexural transducers used e.g. in vibration control or structural health monitoring. At first the model of piezoelectric bimorph beam was investigated. The beam is composed of two actuators loaded by opposite electric potentials which cause the beam to bend. Further, the influence of approximation of electric potential through the thickness was tested on a simple piezoelectric cantilever beam loaded by external tip force. The numerical results obtained using several finite element types are compared mutually and with simplified analytical solution.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
