Charged Particle Activation Analysis

Abstract

Abstract Charged particle activation analysis (CPAA) is an analytical method for elemental analysis. It is based on charged particle (CP) induced nuclear reactions producing radionuclides, that are identified and quantified by their characteristic decay radiation. CPAA allows trace element determination in the bulk of a solid sample, as well as characterization of a thin surface layer, i.e. determination of mass thickness or composition. Advantages of CPAA are: (1) good precision, (2) low detection limit, (3) outstanding accuracy, (4) absolute, i.e. reference method, (5) independent, i.e. based on a totally different principle than more common methods for elemental analysis (atomic/optical emission and mass spectrometry), and hence not subject to the same systematic errors, (6) traceability, (7) not subject to surface contamination for trace element determination in the bulk, (8) if instrumental analysis is not possible it is not subject to reagent blank errors, and (9) errors due to nonquantitative yield (and even nonreproducible yield) can be corrected for. Disadvantages of CPAA are its inherent complexity and costs, it is not suitable for liquid samples, and heating occurs during irradiation. Speciation, depth profiling, or scanning is not possible. This article covers (1) the principles on the slowing down of CPs in matter, nuclear reactions, and interferences; (2) experimental details concerning irradiation and activity measurement; (3) conceptual and experimental procedures and data handling, from the problem to the final result; (4) perspectives. References to relevant databases are made. A systematic overview of all possible CPAA applications is beyond the scope of this article.