Abstract
Activation analysis with charged particles is now more readily available as compact, variable energy cyclotrons are more widespread. Standardization problems have been studied thoroughly so that accuracy could be significantly improved. Most applications of CPAA deal with the determination of light elements such as hydrogen, nitrogen and oxygen in metals and semiconductors. As surface layers can be removed by etching after irradiation, contamination problems can be avoided. For some metals concentrations of carbon and nitrogen were found several orders of magnitude lower than analysed by chemical methods. Due to its high accuracy and precision CPAA is often used as a reference method for certification analysis.
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Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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