Abstract
SiC whiskers from six manufacturers were characterized by bulk chemical techniques, X‐ray photoelectron spectroscopy, X‐ray diffraction, and scanning transmission electron microscopy or scanning electron microscopy. Major component (C, Si, and O) surface chemistries of the whiskers fell into four general categories: high oxygen content with oxide resembling a SiO2, high oxygen content with oxide resembling a Si‐O‐C glass, and hydrocarbon. Several whiskers exhibited significant surface impurities—in particular, Fe. From a morphological viewpoint, significant differences in diameter, debris level, straightness, and types and quantities of defects were observed from one manufacturer to another.
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