Abstract
AbstractThe low energy electron point source (LEEPS) microscope is an instrument for the characterization of structural, electrical, and mechanical properties of single molecules and nanostructures. In this work, we review our efforts in advancing LEEPS as tool for the characterization of electric properties of nanowires. Individual nanowires of different size and material were examined, including compositions of metallic as well as semiconducting character. The nanowires were characterized by electrical conductance measurements with a metallic tip as movable electrode and the sample support as its counterpart. Beyond these measurements, we developed a scheme to deduce the electrical conductivity of a single nanowire directly from its LEEPS image. This substantially reduces the data acquisition time and widens the applicability of LEEPS microscopy.
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