Abstract
Characterization, Analysis, and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications
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https://doi.org/10.1109/tdmr.2023.3343503
Copy DOIPublication Date: Mar 1, 2024 |
Characterization, Analysis, and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications
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