Abstract
Ti(C, N)-based cermets with different N/(C + N) ratios were prepared by vacuum sintering. The effect of nitrogen content on microstructure of Ti(C, N) based cermets was analyzed using a combination of the electron backscatter diffraction in a scanning electron microscope (EBSD/SEM) and transmission electron microscope (TEM). The combination of XRD and SEM/BSE effectively showed the influence of the carbon and nitrogen contents on the core/rim microstructure features. EBSD maps gave a vivid image for hard phase grains, especially the carbonitride grain size distribution, orientation distribution and crack propagation. The combination of EBSD/SEM and TEM revealed a highly coherent interface between the core and rim. The carbonitride particle and the binder had a large high angle boundary and a coherent interface. A constant interface orientation of the carbonitride particle and binder was characterized. The major factors determining the transverse rupture strength and the fracture toughness were discussed in terms of the crack propagation.
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