Abstract
This chapter discusses polarized neutron reflectometry (PNR), which is well suited for determining the nanostructures of magnetic thin films and multilayers. Together with magnetic X-ray scattering, PNR provides a unique means of seeing the vector magnetization with extraordinary spatial detail well beneath the surface. For neutrons this sensitivity to atomic magnetic moments comes about because the neutron itself possesses a magnetic moment, and neutrons can be obtained with a wavelength comparable to interatomic distances. Given the ability to obtain the vector magnetization profile by PNR, a multilayered structure composed of ferromagnetic films separated by intervening layers of another material can be systematically studied to reveal various fundamental magnetic behaviors. The mathematical representation of a neutron plane wave in three dimensions is given. One can impose conservation of energy to define a neutron refractive index analogous to that employed in ordinary light optics. The Specular reflection from a film with a nonuniform scattering length density profile is also elaborated.
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