Abstract
The nano metal-silicon junction exhibits interesting electrical as well as optical response. This chapter exploits effects to afford sensitive photo and molecular detection. Metallic AFM tip near a surface affords proximal probe sensor in term of a Schottky barrier photodetection. On the other hand, STM tunneling gap formed by a metallic STM tip near a conducting surface affords highly sensitive photodetection and spectroscopic material analysis of the surface. Other concepts that are covered include work function contrast-based photodetection, lateral-in plane Schottky barrier of metal-semiconductor contact interface photodetection, Plasmonic Raman scattering detection (SERS), nonmetallic polarization-based SERS nanostructure detection, metal nanowire-Si SERS.
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