Abstract
Alpha aluminum oxide (α-Al2O3) ceramics was coupled and reacted with zinc oxide (ZnO) ceramics at 1200°C for 24 h. Energy dispersive X-ray spectroscopy (EDS) analysis revealed the existence of step-shaped distribution of Al and Zn near the interface between α-Al2O3 and ZnO. Intense ultraviolet (3.75 eV) emission was clearly observed from the layer. On the other hand, very weak emissions were observed outside the layer near the interface. The compound in the layer is considered to be an attractive material for ultraviolet optoelectronics.
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