Abstract
An electron beam focusing structure was incorporated into the gated field emitter arrays where the emitters were screen-printed carbon nanotubes. The focusing structure was comprised of 8-μm-thick bulky SiOx focus gate insulator and Cr focus gate, and exhibited negligible leakage between the gate and the focus gate. In current–voltage measurements, it is found that the anode current strongly depends on both the focus gate and the anode bias voltages. Electron beams were focused well at the anode with a slight overfocusing effect, which is due to the wide electron beam divergence from carbon nanotubes. A new focusing structure based on the simulation is proposed to overcome the overfocusing.
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