Abstract
Semiconductor and metal carbon nanotubes were studied by scanning tunneling microscopy (STM) and spectral ellipsometry. STM measurements with spatial resolution up to 0.15 nm reveal spatially complicated structure of semiconductor nanotube-substrate interface layer. The measurements also registered graphene nanoclusters with hexagonal rings structure on copper. Quantum mechanical numerical calculations of electron density were performed on a carbon nanotube containing 40 atoms.
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