Abstract
We review the application of cantilever-based stress measurements in surface science and magnetism. The application of thin (thickness appr. 0.1 mm) single crystalline substrates as cantilevers has been used successfully to measure adsorbate-induced surface stress changes, lattice misfit induced film stress, and magneto-elastic stress of ferromagnetic monolayers. Surface stress changes as small as 0.01 N/m can be readily measured, and this translates into a sensitivity for adsorbate-coverage well below 0.01 of one layer. Stress as large as several GPa, beyond the elasticity limits of high strength materials, is measured, and it is ascribed to the lattice misfit between film and substrate. Our results point at the intimate relation between surface stress and surface reconstruction, stress-induced structural changes in epitaxially strained films, and strain-induced modifications of the magneto-elastic coupling in ferromagnetic monolayers.
Highlights
The stress-induced curvature of thin substrates offers an appealing way to deduce stress at surfaces and in thin films directly
First experiments on the C-induced clock reconstruction of Ni(001) suggest that this might be so [39]. We present another example where we studied the link between oxygen-induced surface stress change and surface reconstruction of Cu(001) [37]
The study of surface alloys and the understanding of the driving forces behind surface alloy formation are of high interest, as the electronic, magnetic, and structural properties of a few atomic layer thin film are heavily influenced by the interface to the substrate [42,43,44,45]
Summary
The stress-induced curvature of thin substrates offers an appealing way to deduce stress at surfaces and in thin films directly. We present examples of cantilever experiments which we performed to study the role of stress at surfaces and in ultrathin epitaxial films for surface reconstruction, surface alloying, structural transitions and the magnetoelastic coupling in strained ferromagnetic layers.
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