Abstract
In this paper bilayer thin films of 10CGO/8YSZ electrolyte with enhanced O2- conductivity composed of gadolinia doped CeO2 (Ce0,9Gd0,1O2-) and yttria stabilized zirconia 8 mol% Y2O3 doped ZrO2 layers were deposited by Pulsed Laser Deposition (PLD) using various numbers of pulses. This composite has supplementary function in electrochemical devices because 10 CGO can act as interdiffusion barrier with cathode materials. The structure and morphology of these thin films, having thicknesses smaller than 1µm, were investigated by X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The XRD patterns exhibit cubic fluorite structure with a sharp (111) peak. The grain size was found to depend on the thickness. Optical characterization was carried out by spectroscopic ellipsometry (SE) using the Tauc-Lorentz model. Keywords: Laser ablation, Electrolytes, Bilayer Thin Films, Tauc - Lorentz Model, Electrochemical Fuel Cells Devices
Highlights
Experimental part Materials and methodsThe 10 CGO target was synthesized from commercially Ce0.90Gd0.10O1.95 nanocrystalline powder using a Pechini method
In this paper bilayer thin films of 10CGO/8YSZ electrolyte with enhanced O2- conductivity composed of gadolinia doped CeO2 (Ce0,9Gd0,1O2- ) and yttria stabilized zirconia 8 mol% Y2O3 doped ZrO2 layers were deposited by Pulsed Laser Deposition (PLD) using various numbers of pulses
Due to the fact that performance is theoretically influenced by operating temperature and in order to overcome such constrains, it can be exploited the advantages of low resistivity and maximization of O2- conductivity of these thin films by doping ZrO2 with 8 mol% Y2O3
Summary
The 10 CGO target was synthesized from commercially Ce0.90Gd0.10O1.95 nanocrystalline powder using a Pechini method. This is necessary to identify the crystalline structure that will be transfer on the substrate. The characterization of the bilayer thin films of 10CGO/8YSZ/Pt/Si (100) is presented in relation to the same diagrams for identification of crystalline phases. From the XRD pattern for films (b) it was observed a reflection for (400) that indicated the polycrystalline structure of both samples.
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