Abstract
We propose an optical imaging system, in which both illumination and collection are done in far field, that presents a power of resolution better than one-tenth of the wavelength. This is achieved by depositing the sample on a periodically nanostructured substrate illuminated under various angles of incidence. The superresolution is due to the high spatial frequencies of the field illuminating the sample and to the use of an inversion algorithm for reconstructing the map of relative permittivity from the diffracted far field. Thus, we are able to obtain wide-field images with near-field resolution without scanning a probe in the vicinity of the sample.
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