Abstract
The problem of testability and test pattern generation at the highest abstraction level, i.e., based on the network's behavior, is considered for Hopfield networks. Complete testability is proved. A test pattern generation approach based on creation of an equivalent finite state machine is presented, the functional test pattern generation have been proved to allow very high coverage of logic-level faults in the case of finite state machines. An efficient algorithm, using BDDs, is finally described. >
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