Abstract
We present results of beam tests of charged particle detectors based on single-crystal and poly-crystalline Chemical Vapor Deposition (CVD) diamond. We measured the signal pulse height dependence on the particle flux. The detectors were tested over a range of particle fluxes from 2 kHz/cm2 to 20 MHz/cm2. The pulse height of the sensors was measured with pad and pixel readout electronics. The pulse height of the non-irradiated single-crystal CVD diamond pad sensors was stable with respect to flux, while the pulse height of irradiated single-crystal CVD diamond pad sensors decreased with increasing particle flux. The pulse height of the non-irradiated single-crystal CVD diamond pixel detectors decreased slightly with increasing particle flux while the pulse height of the irradiated single-crystal CVD diamond pixel detectors decreased significantly with increasing particle flux. The observed sensitivity to flux is similar in both the diamond pad sensors constructed using diamonds from the Pixel Luminosity Telescope (PLT) irradiated during its pilot run in the Compact Muon Solenoid (CMS) detector and in neutron irradiated diamond pad sensors from the same manufacturer irradiated to the same fluence of neutrons. The pulse height for irradiated poly-crystalline CVD diamond pad sensors proved to be stable with respect to particle flux.
Highlights
Pulse heights at low rate (100 Hz) had similar values to those predicted by the damage curve derived from RD42 beam test data, while those at higher rate (4 MHz) had 1/4 of the predicted pulse height from the RD42 beam test data
The pulse height distributions for single-crystal Chemical Vapor Deposition (CVD) diamond sensors, pad geometry: (4a) neutron irradiated to a fluence of 5×1013 n/cm2 and (4b) in-situ irradiated during the 2012-2013 Pixel Luminosity Telescope (PLT) pilot run
The average pulse height of the non-irradiated singlecrystal diamond pad detector did not depend on particle flux while the avarage pulse height of the non-irradiated diamond pixel detector decreased slightly with increasing particle flux
Summary
We tested two types of CVD diamond sensors, poly-crystalline and single-crystal. Each type was tested with both pixel and pad detector geometries. The metal contacts for the pixel detectors were Ti:W for both the pixel pattern and the backside bias electrode. The pixel pattern consisted of individual pixels with electrode size of 75 μm × 125 μm and 100 μm × 150 μm in pitch. After metalization both Cr/Au and Ti:W devices were annealed at 400 ◦C for 4 mins in a N2 atmosphere. Sample # 1 2 3 4 5 6 7 material single-crystal diamond poly-crystalline diamond single-crystal diamond single-crystal diamond single-crystal diamond single-crystal diamond single-crystal silicon electrode pad pad pad pad pixel pixel pixel fluence and irradiation particles non-irradiated 5×1013 fast reactor neutrons ∼5×1013 n/cm and ∼5×1013 charged hadrons/cm2 5×1013 fast reactor neutrons non-irradiated ∼5×1013 n/cm and ∼5×1013 charged hadrons/cm non-irradiated
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