Abstract
ABSTRACT Ferroelectric properties of heteroepitaxial Ba0.8Sr0.2TiO3 thin films on (001) MgO substrates were studied as a function of film thickness varied from 6 to 980 nm. X-ray diffraction study revealed structural transformation at the film thickness ∼ 70 nm. Both A 1(TO) and E(TO) components of the ferroelectric soft mode exhibited downward shifts near the critical thickness. Dielectric permittivity exhibited maxima in the films with thethickness below 100 nm. Two peaks were observed at ∼18 nm and ∼36 nm. The dielectric nonlinearity near the first maximum was seen to be much higher than near the second one.
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