Abstract
The presence of flaws such as bubbles, stria, and scratches in glass degrades the optical strength of components and leads to intense light scattering, loss of radiation energy, and the appearance of amplitude and phase laser beam distortions, leading to the development of intensity oscillations. The system presented here for searching for defects in optical components operates in a semi-automatic mode and allows us to find various defects and determine their coordinates and dimensions. The characteristics of the system are as follows: the minimum size of a detectable defect is 30 μm, the absolute error in determining its coordinates is 200 μm, and the maximum error in measuring the size is 10%. In the process of certification of optical components, Schlieren or end illumination methods are used, and their combination is used in some cases.
Published Version
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