Auger Electrons as Probes for Composite Micro- and Nanostructured Materials: Application to Solid Electrolyte Interphases in Graphite and Silicon-Graphite Electrodes

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In this study, Auger electron spectroscopy (AES) combined with ion sputtering depth profiling, X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM) have been used in a complementary fashion to examine chemical and microstructural changes in graphite (Gr) and silicon/graphite (Si/Gr) blends contained in the negative electrodes of lithium-ion cells. We demonstrate how AES depth profiling can be used to characterize morphology of the solid electrolyte interphase (SEI) deposits in such heterogeneous media, complementing well-established methods, such as XPS and SEM. In this way we demonstrate that the SEI does not consist of uniformly thick layers on the graphite and silicon; the thickness of the SEI layers in cycle life aged electrodes follows an exponential distribution with a mean of ca. 13 nm for the graphite and ca. 20–25 nm for the silicon nanoparticles (with a crystalline core of 50–70 nm in diameter). A “sticky-sphere” model, in which Si nanoparticles are covered with a layer...