Auger effect limited performance in tunnel field effect transistors

Abstract

Tunnel field-effect-transistors (TFETs) are promising candidates for next generation transistors for low power applications, as the TFETs promise low subthreshold swing (SS). Different from traditional MOSFET, the TFETs rely on energy-efficient switching of band-to-band tunneling (BTBT), therefore the SS in TFETs is not limited by the 60 mV/decade Boltzmann limit. This reduction in energy consumption makes TFETs suitable candidates to replace standard MOSFETs in low power applications. However, most experimentally demonstrated TFETs suffer from low on current[1], and the theoretical low SS is compromised by impurities and Auger generation. To understand the underlying physics and predict the device characteristics of TFETs, sophisticated numerical simulations can be used. On the other hand, physics based compact models are also required to provide fast predictions for existing and new device concepts. Furthermore, a physics based compact model is more efficient to model the effects like Auger generation which could be time-consuming for numerical calculations. In this work, we introduce a physics based compact model for homojunction TFETs with Auger generation effect considered. This compact model is based on the modified Simmons' equation at finite temperature[2]. With our compact model, the possible impact of Auger generation effect to off-current and SS is explored.