Abstract
This letter presents a spin-orbit torque magnetic random access memory (SOT-MRAM) for high-density, reliable, and energy-efficient on-chip memory application. Unlike the conventional SOT-MRAM requiring two access transistors, the proposed MRAM uses only one access transistor along with a Schottky diode in order to achieve high integration density while maintaining the advantages of SOT-MRAM, such as low write energy and enhanced reliability of magnetic tunnel junction. The Schottky diode is forward-biased during read, whereas it is reverse-biased during write to prevent sneak current paths. Our simulation results show that the proposed MRAM can achieve 30% and 50% reduction in bit-cell area in comparison to conventional spin-transfer torque MRAM (STT-MRAM) and SOT-MRAM, respectively, and $\sim 2.5\times $ improvement in write power compared with the STT-MRAM.
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