Abstract
This chapter presents Auger intensities obtained during the formation of very slowly growing Ag overlayer on polycrystalline Au substrate and values of a parameter related to the width of the Ag 356 eV Auger line. In R - t plot, there are present some temporary maxima of increasing values which coincide with the increaments of Ag Auger line. These features of R - t plot can be explained as related to changes of Ag Auger line width caused by changes of values of coordination numbers of Ag atoms at different stages of layer formation. Such interpretation of observed changes allows one to obtain an additional information about mechanism of growth of the layer. These coincidences prove that changes of Ag line width distort noticeably the measured intensity. For this reason, the correction procedure should be applied before any quantitative interpretation of the results.
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