Abstract
Antimony sulfide thin films (thickness, 500 nm) were deposited on chemically deposited CdS thin films (100 nm) obtained on 3 mm glass substrates coated with a transparent conductive coating of SnO2:F (TEC-15 with 15 Ω sheet resistance). Two different chemical formulations were used for depositing antimony sulfide films. These contained (i) antimony trichloride dissolved in acetone and sodium thiosulfate, and (ii) potassium antimony tartrate, triethanolamine, ammonia, thioacetamide and small concentrations of silicotungstic acid. The films were heated at 250 °C in nitrogen. The cell structure was completed by depositing a 200 nm p-type PbS thin film. Graphite paint applied on the PbS thin film and a subsequent layer of silver paint served as the p-side contact. The cell structure: SnO2:F/CdS/Sb2S3 (i or ii)/PbS showed open circuit voltage (Voc) of 640 mV and short circuit current density (Jsc) above 1 mA cm−2 under 1 kW m−2 tungsten–halogen radiation. Four cells, each of 1.7 cm2 area, were series-connected to give Voc of 1.6 V and a short circuit current of 4.1 mA under sunlight (1060 W m−2).
Published Version
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