Antiferromagnetic imaging via ptychographic phase retrieval

Abstract

Antiferromagnetic imaging is critical for understanding and optimizing the properties of antiferromagnetic materials and devices. Despite the widespread use of high-energy electrons for atomic-scale imaging, they have low sensitivity to spin textures. Typically, the magnetic contribution to the phase of a high-energy electron wave is weaker than one percent of the electrostatic potential. Here, we demonstrate direct imaging of antiferromagnetic lattice through precise phase retrieval via electron ptychography, paving the way for magnetic lattice imaging of antiferromagnetic materials and devices.