Abstract
AbstractA precise X‐ray investigation is carried out to probe the lowest‐order anharmonic contribution of the atomic potential of the germanium atom. A total number of 1052 reflections (h + k + l = 4n and 4n ± 1) are precisely measured at room temperature using a spherical single crystal of germanium and using a Nonius CAD‐4 X‐ray diffractometer with crystal monochromatized MoKα radiation. A least‐square refinement program is used to refine the harmonic and anharmonic thermal parameters of the crystal. The refinement gives βGe = (−0.749 ± 1.79) × 10−16 J nm−3 with BGe = (0.528 ± 0.004) × 10−2 nm−2. The reliability index (R) amounts to 1.71% for germanium.
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