Abstract
The resistive transition of (YBCO) 24/(PrBCO) 2 multilayer thin film as a function of both temperature and the angle between applied magnetic field and CuO 2 planes has been measured at a constant magnetic field of 4 T. The angle dependence of characteristic temperature, T*, exhibits either a two-dimensional (2D) or three-dimensional (3D) behavior. The angle dependence of activation energy, U, for flux motion is in agreement with the intrinsic pinning model. The angle dependences of T* and U reveal a lock-in transition when applied field approaches the CuO 2 planes. The behaviors of the dual dimensionality in the dissipation and lock-in transition were discussed.
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