Analyzing of lead, tin and germanium tellurides by means of secondary neutral mass spectrometry: Features, problems and possibilities

Abstract

We review, summarize and augment our recent studies on the problem of using Secondary Neutral Mass Spectrometry method for analyzing PbTe, SnTe and GeTe binary tellurides specimens. The experimental results are discussed with reference to the chemical diversity of the studied compounds, preferential sputtering of their constituents manifesting itself differently in the different tellurium compounds; the large differences in atomic masses of the telluride components; and the morphology of the sputtered surfaces, which has been characterized by means of scanning electron microscopy.