Abstract

An analytical charge control model for sheet carrier density is presented for InAlAs/InGaAs/InAlAs double heterostructure high electron mobility transistor (DH-HEMT). The model uses a polynomial dependence of sheet carrier concentration on position of quasi-Fermi energy level to successfully predict the gradual saturation of charge in the device and is valid from subthreshold region to high conduction region for both the channels. The model has been extended to calculate I d– V d characteristics, transconductance and cut-off frequency of the device.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call