Abstract

Transition edge sensors (TESs) are high-sensitivity thermometers used in cryogenic microcalorimeters which exploit the steep gradient in resistivity with temperature during the superconducting phase transition. Practical TES devices tend to exhibit a white noise of uncertain origin, arising inside the device. We discuss two candidate models for this excess noise, phase slip shot noise (PSSN) and percolation noise. We extend the existing PSSN model to include a magnetic field dependence and derive a basic analytical model for percolation noise. We compare the predicted functional forms of the noise current vs. resistivity curves of both models with experimental data and provide a set of equations for both models to facilitate future experimental efforts to clearly identify the source of excess noise.

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