Abstract
Optical thin film can control the reflection, refraction and transmission of specific wavelength of electromagnetic radiation and have numerous applications such as reflector, anti-reflector, attenuator, photovoltaic cell and refractor in the electromagnetic radiation spectrum. To perform the particular function for which they are designed, precise control of various film parameters such as thickness, composition, roughness, uniformity is necessary. Silicon dioxide, Zinc oxide, Zinc telluride are the most promising materials in optoelectronic and optical applications in the visible region as well as in the infrared and UV region. In this research, the optical properties such as spectral reflectance and transmittance of nano-scale optical thin films have been studied and analyzed for those materials on different substrates to obtain the optimal configuration for the best performance. To obtain this, the equations of reflectance and transmittance for thin film have been derived, then simulated and visualized by Matlab code. By changing film materials, substrates and film thickness, transmittance and reflectance characteristics have been observed and analyzed. The result showed that the reflectance and transmittance characteristics of optical thin film are strongly dependent on the wavelength of electromagnetic spectra. The film and substrate materials are very effective on the reflectance and transmittance characteristics of the optical thin films. It is also found that the reflectance and transmittance characteristics are greatly affected by film thickness. This research work will benefit and enhance the value of nano coating technology to determine the best thin film/substrate configuration in the development of micro- and nano optoelectronic devices.
Highlights
Optical thin-film having any desired reflectance and transmittance characteristics may be produced by depositing very thin layer of material on the surface of another material [1]
The reflectance (Reff) and transmittance (Teff) characteristics of optical thin film are visualized in Figures 2 and 3 as a function of wavelength for SiO2 coating, Zinc oxide (ZnO) coating and Zinc telluride (ZnTe) coating
The amplitude and periodicity of reflectance and transmittance are seriously changed with the film materials SiO2, ZnO and ZnTe
Summary
Optical thin-film having any desired reflectance and transmittance characteristics may be produced by depositing very thin layer of material on the surface of another material [1]. Optical property measurements and analysis tool determines spectral reflectance-transmittance characteristics of optical thin-film over wavelength range of ultraviolet (UV) to infrared (IR) regions [6]. By using this valuable tool, the desired amplitude and periodicity of reflectance and transmittance can be obtained by adjusting film’s material, thickness, optical constant and other parameters related to film material and substrate. The influence of film’s materials, thickness and the substrate on the optical properties of the optical thin film is so high that an extensive study and analysis is still a necessary research issue to understand, control, optimize and develop them for particular application
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