Abstract

Selective removal of the silicon underneath a set of single-turn multilayer interlaced stacked (SMIS) radio-frequency (RF) transformers with nearly perfect magnetic-coupling factor (k <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">IM</sub> ~1) and high resistive-coupling factor (k <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Re</sub> ) is demonstrated. This process is based on the inductively coupled-plasma (ICP) deep trench technology. Improvement of 20.6 and 15.7 dB in isolation (S <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">21</sub> ) were achieved at 5.2 and 8 GHz, respectively, for a dummy open device after the backside ICP etching. Q-factor increases of 102% (from 4.96 to 10.03) and 23.2% (from 2.24 to 2.76), G <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Amax</sub> increases of 11.8% (from 0.76 to 0.85) and 4.5% (from 0.88 to 0.92), and NF <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">min </sub> decreases of 0.49 dB (from 1.22 to 0.73 dB) and 0.19 dB (from 0.55 to 0.36 dB) were achieved at 5.2 and 8 GHz, respectively, for an SMIS transformer with an overall dimension of 170times240 mum <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2 </sup> after the backside ICP etching. The G <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Amax</sub> of 0.85 and 0.92 are both state-of-the-art results among all reported on-chip transformers. Furthermore, the reasons why the SMIS transformer exhibits better performances than the traditional bifilar and the traditional stacked transformer are explained. These results show that the micromachined SMIS transformers are very promising for RF integrated circuit applications

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